Reduce Analysis Cost And Increasing Production Up-Time: ANATEL Clean-In-Place (CIP)

Frequently, CIP processes are validated and verified using laboratory grab sample analysis. The disadvantages of using this on an ongoing basis is that the number of grab samples required can be costly in terms of time and laboratory instrument reagents. In addition, the time to collect grab samples and carry out the tests can delay returning the process vessel to use, thus putting a restriction on the capacity of the production facility, reducing throughput and economies of scale.

The use of on-line direct conductivity TOC & Conductivity verification analyzers located on the CIP skids can eliminate the need for grab-sample analysis. These analyzers use no reagents and can be stable in calibration for up to one year, thus reducing analysis cost and increasing production up-time. In some cases pay-back for the analyzer can be <1year.

In the sterile manufacturing environment, there are a lot of advantages of cleaning the process vessel in place, not least of which is the advantage that keeping it in the cleanroom area means that it is far less likely to be contaminated. Traditional cleaning methods would involve removing the process equipment from the sterile manufacturing environment in order to clean and sterilize it before moving the equipment back into the sterile environment. This type of process greatly increases the risk of contamination as the equipment is moved in and out of the controlled environment.